To tackle the difficulties inherent in the analysis of deep sub-micron designs, Agilent Technologies and Auriga Measurement Systems have agreed to jointly develop integrated device-modeling systems for the semiconductor industry. The companies plan to pair Agilent’s IC-CAP parameter extraction and device modeling software and instrumentation with Auriga’s test instrumentation. Deep sub-micron requires much closer integration among the various tools than previous technologies. Engineers can no longer manually integrate test results into computer models, because both the tests are increasingly more difficult and the volume of parameters that need to be moved between analysis tools is too large to handle reliably.

As part of this agreement, Auriga plans to develop software modules for IC-CAP, providing measurement and hardware drivers to allow data acquisition, and new device model extraction routines for device models. Auriga also plans to port its Tajima field effect transistor model into Agilent’s Advanced Design System (ADS) and IC-CAP. The integration will allow advanced RF and microwave circuit and system simulations and efficient model parameter extraction. More information can be found at: www.agilent.com/find/eesof and www.auriga-ms.com.

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